Handheld analyzer and method for measuring elemental concentration

OPT OpenIR > 半导体激光器专利数据库

	Handheld analyzer and method for measuring elemental concentration
其他题名	Handheld analyzer and method for measuring elemental concentration
	GAPONTSEV, VALENTIN; KURATEV, IVAN; BIRYUKOV, ROMAN; FEDYNA, EKATERINA; PASHKO, SERGEY; MELOVATSKY, OLEG; REZNIKOV, ANDREY; KOVYZHENKO, NADEZHDA; OULIANOV, DMITRI
	2019-05-09
专利权人	IPG PHOTONICS CORPORATION
公开日期	2019-05-09
授权国家	美国
专利类型	发明申请
摘要	The disclosed method and handheld analyzer of elemental concentration measurement is based on spectral analysis of high temperature highly ionized plasma generated by laser-generated pulses. Due to a high pulse energy and short pulse duration, high intensity singly and multiply charged ion lines in addition to neutral atomic lines are excited. The pulsed laser source of the disclosed analyzer is configured to output a train of pulses of signal light at a 5-6 signal wavelength at a pulse repetition rate from 0.1 to 50 kHz, pulses duration from 0.01 to 5 ns, pulse energy between 100 and 1000 uJ and has a beam spot on the surface of the sample varying 1 to 60 μm. The above-described parameters provide at least a 20 GW/cm2 laser power density sufficient to induce a high temperature, highly ionized plasma (plasma) which allows measuring the carbon concentration in carbon steels by employing doubly charged ionic line CII with a detection limit down to 0.01% and other elements commonly present in carbon steels with detection limit below 0.01%.
其他摘要	所公开的方法和元素浓度测量的手持式分析仪基于由激光产生的脉冲产生的高温高电离等离子体的光谱分析。由于高脉冲能量和短脉冲持续时间，除中性原子线之外还激发高强度单电荷和多电荷离子线。所公开的分析器的脉冲激光源被配置为以0.1至50kHz的脉冲重复率输出5-6信号波长的信号光脉冲序列，脉冲持续时间为0.01至5ns，脉冲能量在100至100之间。 1000 uJ并且在样品表面上具有1至60μm的束斑。上述参数提供至少20GW / cm 2的激光功率密度足以诱导高温，高电离的等离子体（等离子体），其允许通过采用双电荷测量碳钢中的碳浓度。离子线CII，检测限低至0.01％，碳钢中常见的其他元素，检出限低于0.01％。
主权项	A method of measuring elemental concentration by utilizing a handheld analyzer, comprising: energizing a pulsed laser, thereby outputting a train of pulses at a pulse repetition rate from 0.1 to 50 kHz, with each pulse having duration from 0.01 to 5 ns and pulse energy between 50 and 1000 uJ; focusing the laser beam onto a sample to be analyzed without the presence of inert gases, thereby generating a high temperature, highly ionized plasma which irradiates characteristic spectra in a desired wavelength range; scanning the focused laser beam across a zone of the sample so as to generate the plasma at each location within the zone by a single pulse, thereby continuously focusing the laser beam on the sample; and collecting plasma radiation in a spectrometer, thereby producing a signal output; and processing the signal output, thereby measuring concentration of elements, which include carbon present in the sample, wherein a carbon concentration is measured in the generated plasma by using a doubly charged carbon ion spectral line in a wavelength range including 229.687 nm wavelength.
申请日期	2017-04-11
专利号	US20190137403A1
专利状态	失效
申请号	US16/092985
公开（公告）号	US20190137403A1
IPC 分类号	G01N21/71 \| G01J3/443 \| H01S3/16 \| H01S3/11 \| H01S3/109 \| H01S3/0941 \| H01S3/067 \| H01S3/094
专利代理人	-
代理机构	-
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/62569
专题	半导体激光器专利数据库
作者单位	IPG PHOTONICS CORPORATION
推荐引用方式 GB/T 7714	GAPONTSEV, VALENTIN,KURATEV, IVAN,BIRYUKOV, ROMAN,et al. Handheld analyzer and method for measuring elemental concentration. US20190137403A1[P]. 2019-05-09.