Gas measurement system

OPT OpenIR > 半导体激光器专利数据库

	Gas measurement system
其他题名	Gas measurement system
	ZEMEK, PETER; CARANGELO, ROBERT M.; YE, HONGKE; WRIGHT, ANDREW
	2018-02-01
专利权人	MKS INSTRUMENTS, INC.
公开日期	2018-02-01
授权国家	世界知识产权组织
专利类型	发明申请
摘要	Presented herein are systems and methods for quantifying trace and/or ultra-trace levels of a species - for example, H?2#191S or H?2#191O - in a natural gas line. The systems and methods employ a tunable laser, such as a tunable diode laser, vertical-cavity surface-emitting laser (VCSEL), external cavity diode laser or a vertical external-cavity surface-emitting laser (VECSEL) or a tunable quantum cascade laser (QCL). The laser produces an output beam over a set of one or more relatively narrow, high resolution wavelength bands at a scan rate from about 0.1 Hz to about 1000 Hz. A natural gas sample comprising a trace level of a species of interest passes through a flow cell into which the output beam from the laser is guided. An optical detector receives light from the flow cell, producing a signal indicative of the absorption attenuation from which the concentration of the trace species is determined.
其他摘要	本文提供了用于量化物质的痕量和/或超痕量水平的系统和方法 - 例如，天然气管线中的H 2＃191S或H 2 2＃191O。该系统和方法采用可调谐激光器，例如可调谐二极管激光器，垂直腔面发射激光器（VCSEL），外腔二极管激光器或垂直外腔表面发射激光器（VECSEL）或可调谐量子级联激光器。（QCL）。激光器以一组一个或多个相对窄的高分辨率波长带以约0.1Hz至约1000Hz的扫描速率产生输出光束。包含痕量水平的目标物质的天然气样品通过流动池，来自激光器的输出光束被引导到该流动池中。光学检测器接收来自流动池的光，产生指示吸收衰减的信号，从该信号确定痕量物质的浓度。
主权项	A spectroscopy system for measuring a trace level and/or an ultra-trace of a first gas in a natural gas sample, the system comprising: a laser for producing an output beam over a set of one or more discrete or continuous wavelength bands at a scan rate from about 0.1 Hz to about 1000 Hz over the set of one or more discrete or continuous wavelength bands; transmitting optics for guiding and/or shaping the output beam from the tunable diode laser to the natural gas sample; an optical detector for receiving light from the natural gas sample and producing a detector signal corresponding to the received light; and a processor of a computing device and a memory (non-transitory computer-readable medium) having instructions stored thereon, wherein the instructions, when executed by the processor, cause the processor to compute the trace level and/or ultra-trace level of the first gas in the natural gas sample from the signal corresponding to the received light.
申请日期	2017-07-25
专利号	WO2018022542A1
专利状态	未确认
申请号	PCT/US2017/043588
公开（公告）号	WO2018022542A1
IPC 分类号	G01N21/31 \| G01N21/01 \| G01N1/24
专利代理人	MONROE, MARGO R. ET AL.
代理机构	-
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/56625
专题	半导体激光器专利数据库
作者单位	MKS INSTRUMENTS, INC.
推荐引用方式 GB/T 7714	ZEMEK, PETER,CARANGELO, ROBERT M.,YE, HONGKE,et al. Gas measurement system. WO2018022542A1[P]. 2018-02-01.