Device noise measurement system

OPT OpenIR > 半导体激光器专利数据库

	Device noise measurement system
其他题名	Device noise measurement system
	MICHAEL, CHRISTOPHER, , COX; NIGEL, JOSEPH, , COPNER
	2001-02-21
专利权人	THE SECRETARY OF STATE FOR DEFENCE
公开日期	2001-02-21
授权国家	英国
专利类型	授权发明
摘要	A system and method for determining noise power levels across a range of frequencies of the optical signal output from a device operating at a specified optical power and drive current and, in particular, for determining relative intensity noise values (RIN). The system may comprise a reference laser for generating an optical reference signal and a photodetector for converting the optical signal output from the reference laser and the device under test into equivalent electrical signals. The system also comprises means for measuring ac and dc components of the electrical signals output from the photodetector. The system may be used to measure RIN levels to an accuracy of less than 1 dB. Such measurements are of particular importance in the field of fibre optic telecommunications.; The reference laser is shot noise limited in the frequency range of interest, typically between 20 MHz and 20 GHz, and has a narrow linewidth, typically less than 5 kHz. A shot noise limited reference laser signal may be achieved by means of optically attenuating a higher power reference laser signal to the required lower optical power. The incorporation of a reference laser enables a simple calibration process to take account of factors such as the responsivity, gain and resolution bandwidth of the system apparatus across the whole measurement range.
其他摘要	一种系统和方法，用于确定从在特定光功率和驱动电流下操作的设备输出的光信号的频率范围内的噪声功率电平，特别是用于确定相对强度噪声值（RIN）。该系统可包括用于产生光学参考信号的参考激光器和用于将从参考激光器和被测器件输出的光学信号转换成等效电信号的光电检测器。该系统还包括用于测量从光电检测器输出的电信号的交流和直流分量的装置。该系统可用于测量RIN水平，精度小于1 dB。这种测量在光纤通信领域特别重要。参考激光器是在感兴趣的频率范围内受限的散粒噪声，通常在20MHz和20GHz之间，并且具有窄的线宽，通常小于5kHz。可以通过将较高功率参考激光信号光学衰减到所需的较低光功率来实现散粒噪声受限的参考激光信号。参考激光器的结合使得简单的校准过程能够考虑诸如整个测量范围内的系统设备的响应度，增益和分辨率带宽之类的因素。
申请日期	1997-10-13
专利号	GB2332514B
专利状态	失效
申请号	GB1999008475
公开（公告）号	GB2332514B
IPC 分类号	H01S3/00 \| H01S5/00 \| G01R31/26
专利代理人	-
代理机构	-
文献类型	专利
条目标识符	http://ir.opt.ac.cn/handle/181661/34572
专题	半导体激光器专利数据库
作者单位	THE SECRETARY OF STATE FOR DEFENCE
推荐引用方式 GB/T 7714	MICHAEL, CHRISTOPHER, , COX,NIGEL, JOSEPH, , COPNER. Device noise measurement system. GB2332514B[P]. 2001-02-21.

条目包含的文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
GB2332514B.PDF（1047KB）	专利		开放获取	CC BY-NC-SA	请求全文