Xi'an Institute of Optics and Precision Mechanics,CAS
Device and method for the determination of the quality of surfaces | |
其他题名 | Device and method for the determination of the quality of surfaces |
SCHWARZ, PETER; SPERLING, UWE | |
2008-06-24 | |
专利权人 | BYK-GARDNER GMBH |
公开日期 | 2008-06-24 |
授权国家 | 美国 |
专利类型 | 授权发明 |
摘要 | The present invention relates to a device and method for making quantified determinations of the quality of surfaces and wherein the device comprises an optical system with a first optical means and a second optical means as well as a control and evaluation means and an output (display) means. Said first optical means comprises an illuminating means having at least one LED as its light source and serves the function of illuminating the measurement surface at a predetermined angle. Said second optical means is likewise directed at a predetermined angle to the measurement surface and receives the reflected light. A photo sensor of said second optical means emits an electrical measurement signal which is characteristic of said reflected light. The light emitted from the illuminating means is configured such that its spectral characteristic comprises blue, green and red spectral components in the visible light spectrum. A filter means is arranged in the path of radiation between the light source and the photo sensor and which changes the spectral characteristics of the incident light so as to approach a predetermined spectral distribution. The control and evaluation means control the measurement sequence and evaluate the reflected light, deriving therefrom at least one parameter which is characteristic of the surface. |
其他摘要 | 本发明涉及一种用于对表面质量进行量化确定的装置和方法,其中该装置包括具有第一光学装置和第二光学装置的光学系统以及控制和评估装置和输出(显示器)。手段。所述第一光学装置包括照明装置,该照明装置具有至少一个LED作为其光源并且用于以预定角度照射测量表面的功能。所述第二光学装置同样以预定角度指向测量表面并接收反射光。所述第二光学装置的光传感器发射电测量信号,该电测量信号是所述反射光的特征。 从照射装置发射的光被配置成使得其光谱特性包括可见光谱中的蓝色,绿色和红色光谱分量。滤光器装置布置在光源和光传感器之间的辐射路径中,并且改变入射光的光谱特性以接近预定的光谱分布。控制和评估装置控制测量序列并评估反射光,由此得出至少一个表面特征的参数。 |
申请日期 | 2000-06-30 |
专利号 | US7391518 |
专利状态 | 授权 |
申请号 | US09/607827 |
公开(公告)号 | US7391518 |
IPC 分类号 | G01N21/00 | G01B11/30 | G01N21/47 | G01N21/55 | G01J3/10 | G01J3/12 | G01J3/28 | G01J3/51 | G01N21/25 | G01N21/57 |
专利代理人 | - |
代理机构 | OHLANDT,GREELEY,RUGGIERO & PERLE L.L.P. |
文献类型 | 专利 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/34474 |
专题 | 半导体激光器专利数据库 |
作者单位 | BYK-GARDNER GMBH |
推荐引用方式 GB/T 7714 | SCHWARZ, PETER,SPERLING, UWE. Device and method for the determination of the quality of surfaces. US7391518[P]. 2008-06-24. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
US7391518.PDF(1374KB) | 专利 | 开放获取 | CC BY-NC-SA | 请求全文 |
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