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Multi-view object topography measurement with optical sectioning structured illumination microscopy
Ren, Feifei1,2; Wang, Zhaojun1,2; Qian, Jia1,2; Liang, Yansheng1; Dang, Shipei1,2; Cai, Yanan1,2; Bianco, Piero R.3; Yao, Baoli1; Lei, Ming1
作者部门瞬态光学研究室
2019-08-10
发表期刊Applied Optics
ISSN1559128X;21553165
卷号58期号:23页码:6288-6294
产权排序1
摘要

Various optical instruments have been developed for three-dimensional (3D) surface topography, including the white light interference, reflectance confocal microscopes, and digital holographic microscopes, etc. However, the steep local slope of objects may cause the light to be reflected in a way that it will not be captured by the objective lens because of the finite collection angle of the objective. To solve this "shadow problem," we report a method to enlarge the collection angle range of optical sectioning structured illumination microscopy by capturing sectioned images of the objects from multiple angle of views. We develop a multi-view image fusion algorithm to reconstruct a single 3D image. Using this method, we detect previously invisible details whose slopes are beyond the collection angle of the objective. The proposed approach is useful for height map measurement and quantitative analyses in a variety of fields, such as biology, materials science, microelectronics, etc. © 2019 Optical Society of America.

DOI10.1364/AO.58.006288
收录类别SCI ; EI
语种英语
WOS记录号WOS:000480414100013
出版者OSA - The Optical Society
EI入藏号20193307307652
引用统计
被引频次:11[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.opt.ac.cn/handle/181661/31696
专题瞬态光学研究室
通讯作者Lei, Ming
作者单位1.China State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China;
2.University of Chinese Academy of Sciences, Beijing; 100049, China;
3.Department of Microbiology and Immunology, Department of Biochemistry, Center for Single Molecule Biophysics, 321 Carry Hall, University at Buffalo, Buffalo; NY; 14214, United States
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Ren, Feifei,Wang, Zhaojun,Qian, Jia,et al. Multi-view object topography measurement with optical sectioning structured illumination microscopy[J]. Applied Optics,2019,58(23):6288-6294.
APA Ren, Feifei.,Wang, Zhaojun.,Qian, Jia.,Liang, Yansheng.,Dang, Shipei.,...&Lei, Ming.(2019).Multi-view object topography measurement with optical sectioning structured illumination microscopy.Applied Optics,58(23),6288-6294.
MLA Ren, Feifei,et al."Multi-view object topography measurement with optical sectioning structured illumination microscopy".Applied Optics 58.23(2019):6288-6294.
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