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Preparation and characteristics of the wide gap semiconductor Mg0.18Zn0.82O thin film by L-MBE
He, YN; Zhang, JW; Yang, XD; Xu, QA; Liu, XH; Zhu, CC; Hou, X
2005-02-01
发表期刊MICROELECTRONICS JOURNAL
卷号36期号:2页码:125-128
摘要The high purity ZnO ceramic target and the (MgO)(0.1)(ZnO)(0.9) target were fabricated. The wurtzite-phase ZnO thin film and ternary MgxZn1-xO thin film were grown on sapphire (0001) substrates by laser molecular beam epitaxy (L-MBE) from the sintered ceramic targets separately. The films' transmittance spectra at room temperature for the ZnO film and the MgxZn1-xO film were measured and compared while their room temperature photoluminescence spectra were done. The band-gap modulation is realized from 3.31 eV for the ZnO film to 3.64 eV for the MgxZn1-xO alloy film. The Mg content x in the MgxZn1-xO alloy film was determined to be 0.18. (C) 2004 Elsevier Ltd. All rights reserved.
文章类型Article
关键词Mgzno Alloy Thin Film Zno Thin Film L-mbe Ceramic Target
WOS标题词Science & Technology ; Technology
DOI10.1016/j.mejo.2004.11.005
收录类别SCI ; EI
关键词[WOS]ROOM-TEMPERATURE ; ZNO FILMS ; MGXZN1-XO ; SUBSTRATE ; GROWTH ; ALLOY
语种英语
WOS研究方向Engineering ; Science & Technology - Other Topics
WOS类目Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology
WOS记录号WOS:000226874000005
引用统计
被引频次:12[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.opt.ac.cn/handle/181661/25138
专题瞬态光学研究室
作者单位1.Xian Jiaotong Univ, Dept Elect Sci & Technol, Sch Elect & Informat, Xian 710049, Peoples R China
2.Acad Sinica, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt, Xian 710068, Peoples R China
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He, YN,Zhang, JW,Yang, XD,et al. Preparation and characteristics of the wide gap semiconductor Mg0.18Zn0.82O thin film by L-MBE[J]. MICROELECTRONICS JOURNAL,2005,36(2):125-128.
APA He, YN.,Zhang, JW.,Yang, XD.,Xu, QA.,Liu, XH.,...&Hou, X.(2005).Preparation and characteristics of the wide gap semiconductor Mg0.18Zn0.82O thin film by L-MBE.MICROELECTRONICS JOURNAL,36(2),125-128.
MLA He, YN,et al."Preparation and characteristics of the wide gap semiconductor Mg0.18Zn0.82O thin film by L-MBE".MICROELECTRONICS JOURNAL 36.2(2005):125-128.
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