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Deployment precision measurement modeling of a deployable space telescope based on tape springs
Li C(李创); Feng XG(冯学贵)
2011
会议名称Seventh International Symposium on Precision Engineering Measurements and Instrumentation
会议录名称Proceedings of SPIE - The International Society for Optical Engineering
卷号8321
页码83212R
会议日期2011-8
会议地点Yunnan, China
出版地P.O. Box 10, Bellingham, WA 98227-0010, United States
会议主办者合肥工业大学
出版者Society of Photo-Optical Instrumentation Engineers (SPIE)
产权排序1
摘要Tape springs have many advantages to develop spaced-based deployable systems because of their simple structures, light weights, high stiffness, and the abilities of self-deploy and self-lock. Their applications in deployable space structures make the spaced-based systems fulfill the requirements of light weight and compact launching volume. A new kind of deployable space telescope under research uses tape springs as the support structure of secondary mirror. Before launch, the support structure of secondary mirror is folded, and deployed when on orbit. In order to achieve near diffraction limited imaging quality, the deployment precision must reach the level consistent with the optical compensation system. We designed an accurate measuring system based on position sensitive detectors (PSDs) to measure the deployment precision. The measuring system includes 3 laser diodes, 3 two-dimensional PSDs around the primary mirror of the deployable telescope, and 3 small mirrors around the secondary mirror. The equations linking the PSD readings and the six-degree-of-freedom displacement of the secondary mirror were deduced. With these equations, the deployment errors can be resolved.
关键词Deployable Space Telescope Six-degree-of-freedom Measurement Position Sensitive Detector Tape Spring
学科领域空间探测器
作者部门空间光学技术研究室
收录类别其他
语种英语
文献类型会议论文
条目标识符http://ir.opt.ac.cn/handle/181661/14416
专题空间光学技术研究室
推荐引用方式
GB/T 7714
Li C,Feng XG. Deployment precision measurement modeling of a deployable space telescope based on tape springs[C]. P.O. Box 10, Bellingham, WA 98227-0010, United States:Society of Photo-Optical Instrumentation Engineers (SPIE),2011:83212R.
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