Novel method to examine phase object by the use of TFT-LCD

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	Novel method to examine phase object by the use of TFT-LCD
	Guo Rongli; Yao Baoli(姚保利); Han Jun; Yu Xun; Nie Liang; Duan Cunli; Wang Fan
	2010
会议名称	5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
会议录名称	Proceedings of SPIE - The International Society for Optical Engineering
页码	76563D
会议日期	2010-04-26
会议地点	Dalian, China
出版地	P.O. Box 10, Bellingham, WA 98227-0010, United States
会议主办者	The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE)
出版者	SPIE
学科领域	物理科学和化学
作者部门	瞬态光学国家重点实验室
收录类别	EI
ISBN号	9780819480866
语种	英语
文献类型	会议论文
条目标识符	http://ir.opt.ac.cn/handle/181661/11850
专题	瞬态光学研究室
推荐引用方式 GB/T 7714	Guo Rongli,Yao Baoli,Han Jun,et al. Novel method to examine phase object by the use of TFT-LCD[C]. P.O. Box 10, Bellingham, WA 98227-0010, United States:SPIE,2010:76563D.