Influence of annealing temperature on the performance of Ge film and photon-counting imaging system | |
Zhao, Feifei1,2; Zhao, Baosheng1; Sai, Xiaofeng1; Zhang, Xinghua1,2; Wei, Yonglin1; Zou, Wei1 | |
作者部门 | 光电子学研究室 |
2010-04-10 | |
发表期刊 | CHINESE OPTICS LETTERS |
ISSN | 0003-6951 |
卷号 | 8期号:4页码:361-364 |
摘要 | Compared with the traditional image intensifier with phosphor screen readout, the photon-counting imaging detector with charge induction readout is more beneficial in several aspects (e.g., good imaging properties and time resolution) to astronomy, reconnaissance, bioluminescence, and materials research. However, the annealing temperature during the tube-making process can affect the properties of the Ge film, and consequently impair the performance of the detector. Therefore, the influence of annealing temperature on Ge film and on the detector is studied in order to determine the crucial parameters. The Ge films are prepared on ceramic and quartz glass by the use of an electron gun. They are analyzed by scanning electron microscope (SEM), high-resistance meter, and X-ray diffraction (XRD). The results show that the optimum substrate and annealing temperature are ceramic plate and 250 degrees C, respectively. |
文章类型 | Article |
WOS标题词 | Science & Technology ; Physical Sciences |
DOI | 10.3788/COL20100804.0361 |
收录类别 | SCI ; EI |
关键词[WOS] | READ-OUT ; POSITION ; DETECTORS ; PARTICLE ; ANODES ; WEDGE ; EBCCD |
语种 | 英语 |
WOS研究方向 | Optics |
WOS类目 | Optics |
WOS记录号 | WOS:000276945900006 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/10015 |
专题 | 光电子学研究室 |
作者单位 | 1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China |
推荐引用方式 GB/T 7714 | Zhao, Feifei,Zhao, Baosheng,Sai, Xiaofeng,et al. Influence of annealing temperature on the performance of Ge film and photon-counting imaging system[J]. CHINESE OPTICS LETTERS,2010,8(4):361-364. |
APA | Zhao, Feifei,Zhao, Baosheng,Sai, Xiaofeng,Zhang, Xinghua,Wei, Yonglin,&Zou, Wei.(2010).Influence of annealing temperature on the performance of Ge film and photon-counting imaging system.CHINESE OPTICS LETTERS,8(4),361-364. |
MLA | Zhao, Feifei,et al."Influence of annealing temperature on the performance of Ge film and photon-counting imaging system".CHINESE OPTICS LETTERS 8.4(2010):361-364. |
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文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
Influence of anneali(3770KB) | 期刊论文 | 出版稿 | 限制开放 | CC BY-NC-SA | 请求全文 |
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