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Experimental study of the damage of silicon photoelectric detector materials induced by repetitively-pulsed femtosecond laser 会议论文
Proceedings of SPIE - The International Society for Optical Engineering, 2013
Authors:  Cai Yue;  Ma Zhi-Liang;  Zhang Zhen;  Cheng Guang-Hua;  Ye Xi-Sheng;  Cheng De-Yan;  Hui Y(会议)
Adobe PDF(319Kb)  |  Favorite  |  View/Download:187/0  |  Submit date:2014/09/17