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Extended focused imaging in microscopy using structure tensor and guided filtering
Ren, Zhenbo1,2; Guan, Peiyan3; Lam, Edmund Y.3; Zhao, Jianlin1
Department瞬态光学研究室
2021-05
Source PublicationOptics and Lasers in Engineering
ISSN01438166
Volume140
Contribution Rank1
Abstract

The limited depth-of-field (DOF) in optical microscopic imaging systems prevents them from capturing an entirely focused images when the imaged scene is thick and covers a wide range of depth. Specimens lying outside the DOF is defocused and thus blurred, hindering the subsequent observation and analysis. Extended focused imaging aims at yielding a single all-in-focus image by combining the in-focus information from a stack of partially focused images. In this paper, we present a new algorithm for digitally extending the low DOF of a microscopic imaging system. The method is based on the two-scale decomposition of an image into a base layer and a detail layer, both of which contain information of different scales. Then, with the structure tensor, which is uniquely advantageous for autofocusing multi-focal planes, as the focus measure, initial weight maps are generated. The guided filtering is then employed to optimize the weighted averaging scheme for the fusion of the base and detail layers. We examine the proposed algorithm under incoherent and coherent imaging modalities, i.e., bright-field microscopy and digital holographic microscopy. Qualitative and quantitative comparisons with the existing approaches are carried out using extensive experimental data. The results show the advantages and superior performance of the proposed scheme even in the presence of coherent noise. © 2021 Elsevier Ltd

KeywordExtended focused imaging Microscopy Digital holography Structure tensor Guided filter
DOI10.1016/j.optlaseng.2021.106549
Indexed ByEI
Language英语
PublisherElsevier Ltd
EI Accession Number20210409818635
Citation statistics
Document Type期刊论文
Identifierhttp://ir.opt.ac.cn/handle/181661/94277
Collection瞬态光学研究室
Corresponding AuthorRen, Zhenbo
Affiliation1.MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions, and Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an; 710129, China;
2.State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; Shaanxi; 710119, China;
3.Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam, Hong Kong
Recommended Citation
GB/T 7714
Ren, Zhenbo,Guan, Peiyan,Lam, Edmund Y.,et al. Extended focused imaging in microscopy using structure tensor and guided filtering[J]. Optics and Lasers in Engineering,2021,140.
APA Ren, Zhenbo,Guan, Peiyan,Lam, Edmund Y.,&Zhao, Jianlin.(2021).Extended focused imaging in microscopy using structure tensor and guided filtering.Optics and Lasers in Engineering,140.
MLA Ren, Zhenbo,et al."Extended focused imaging in microscopy using structure tensor and guided filtering".Optics and Lasers in Engineering 140(2021).
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