Extended focused imaging in microscopy using structure tensor and guided filtering | |
Ren, Zhenbo1,2; Guan, Peiyan3; Lam, Edmund Y.3; Zhao, Jianlin1 | |
作者部门 | 瞬态光学研究室 |
2021-05 | |
发表期刊 | Optics and Lasers in Engineering |
ISSN | 01438166 |
卷号 | 140 |
产权排序 | 1 |
摘要 | The limited depth-of-field (DOF) in optical microscopic imaging systems prevents them from capturing an entirely focused images when the imaged scene is thick and covers a wide range of depth. Specimens lying outside the DOF is defocused and thus blurred, hindering the subsequent observation and analysis. Extended focused imaging aims at yielding a single all-in-focus image by combining the in-focus information from a stack of partially focused images. In this paper, we present a new algorithm for digitally extending the low DOF of a microscopic imaging system. The method is based on the two-scale decomposition of an image into a base layer and a detail layer, both of which contain information of different scales. Then, with the structure tensor, which is uniquely advantageous for autofocusing multi-focal planes, as the focus measure, initial weight maps are generated. The guided filtering is then employed to optimize the weighted averaging scheme for the fusion of the base and detail layers. We examine the proposed algorithm under incoherent and coherent imaging modalities, i.e., bright-field microscopy and digital holographic microscopy. Qualitative and quantitative comparisons with the existing approaches are carried out using extensive experimental data. The results show the advantages and superior performance of the proposed scheme even in the presence of coherent noise. © 2021 Elsevier Ltd |
关键词 | Extended focused imaging Microscopy Digital holography Structure tensor Guided filter |
DOI | 10.1016/j.optlaseng.2021.106549 |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000640981300029 |
出版者 | Elsevier Ltd |
EI入藏号 | 20210409818635 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/94277 |
专题 | 瞬态光学研究室 |
通讯作者 | Ren, Zhenbo |
作者单位 | 1.MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions, and Shaanxi Key Laboratory of Optical Information Technology, School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an; 710129, China; 2.State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; Shaanxi; 710119, China; 3.Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam, Hong Kong |
推荐引用方式 GB/T 7714 | Ren, Zhenbo,Guan, Peiyan,Lam, Edmund Y.,et al. Extended focused imaging in microscopy using structure tensor and guided filtering[J]. Optics and Lasers in Engineering,2021,140. |
APA | Ren, Zhenbo,Guan, Peiyan,Lam, Edmund Y.,&Zhao, Jianlin.(2021).Extended focused imaging in microscopy using structure tensor and guided filtering.Optics and Lasers in Engineering,140. |
MLA | Ren, Zhenbo,et al."Extended focused imaging in microscopy using structure tensor and guided filtering".Optics and Lasers in Engineering 140(2021). |
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文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
Extended focused ima(3705KB) | 期刊论文 | 出版稿 | 限制开放 | CC BY-NC-SA | 请求全文 |
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