Investigating the effect of source contamination on eXTP/SFA | |
Zhang, Juan1; Li, Gang1; Ge, Mingyu1; Kirsch, Christian2; Lorenz, Maximilian2; Wilms, Joern2; Qi, Liqiang1; Sheng, Lizhi3; Yang, Yi-Jung1; Dauser, Thomas2; Xu, Yupeng1; Lu, Fangju1; Yang, Yanji1; Wang, Yusa1; Chen, Yong1 | |
2020 | |
会议名称 | Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray |
会议录名称 | Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray |
卷号 | 11444 |
会议日期 | 2020-12-14 |
会议地点 | Virtual, Online, CA, United states |
出版者 | SPIE |
产权排序 | 3 |
摘要 | The Spectroscopy Focusing Array (SFA) onboard the enhanced X-ray Timing and Polarimetry (eXTP) observatory consists of 9 modules, each comprising a Wolter type I telescope with a field of view (FOV) around 16 arcminutes and a focal plane silicon drift detector (SDD) with 19 hexagonal pixels. Due to the large size of each individual SDD pixel (each pixel corresponds to an area of ∼ 3.6 arcminutes in diameter) and the limited pixel number, SFA can not obtain a real image of the observed region like many other X-ray imaging telescopes. Thus, contamination from nearby bright sources needs to be considered when we study the properties of the target source. We simulate such contaminations using the SIXTE simulator. In this paper we present the results by taking observations of the millisecond pulsar PSR J0437-4715 as an example, and discuss the cases for contamination on background or target source respectively. © 2020 SPIE |
关键词 | eXTP/SFA nearby source contamination |
作者部门 | 光电子学研究室 |
DOI | 10.1117/12.2561944 |
收录类别 | EI ; CPCI |
ISBN号 | 9781510636750 |
语种 | 英语 |
ISSN号 | 0277786X;1996756X |
WOS记录号 | WOS:000674737700034 |
EI入藏号 | 20210309778734 |
引用统计 | |
文献类型 | 会议论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/94268 |
专题 | 光电子学研究室 |
通讯作者 | Zhang, Juan |
作者单位 | 1.Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing; 100049, China; 2.Remeis Observatory and ECAP, University Erlangen-Nurnberg, Sternwartstr. 7, Bamberg; 96049, Germany; 3.XIOPM, Xi'an Institute of Optics and Precision Mechanics, CAS, NO.17 Xinxi Road, Xi'an, Shanxi, China |
推荐引用方式 GB/T 7714 | Zhang, Juan,Li, Gang,Ge, Mingyu,et al. Investigating the effect of source contamination on eXTP/SFA[C]:SPIE,2020. |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
Investigating the ef(10963KB) | 会议论文 | 限制开放 | CC BY-NC-SA | 请求全文 |
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