The influence of CCD undersampling on the encircled energy of SVOM-VT | |
Xue, Xun1,2,3; Zhang, Chunmin1,3; Zhao, Jianke2; Zhou, Yan2; Liu, Shangkuo2; Kewei, E.2; Li, Kun2; Wang, Zhengfeng2; Li, Jing2 | |
2019 | |
会议名称 | Applied Optics and Photonics China 2019: Space Optics, Telescopes, and Instrumentation, AOPC 2019 |
会议录名称 | AOPC 2019: Space Optics, Telescopes, and Instrumentation |
卷号 | 11341 |
会议日期 | 2019-07-07 |
会议地点 | Beijing, China |
出版者 | SPIE |
产权排序 | 1 |
摘要 | SVOM-VT has entered the initial phase development stage, and encircled energy is its key performance index. In the development process, it is necessary to determine the encircled energy of the optical lens stage and the system stage. The image recording of a CCD detector includes two imaging processes: one is the pixel integration imaging process, in which the output signal of each pixel is proportional to the area integration of the incident light intensity on the surface of the pixel; the other is the discrete sampling process, in which the continuous graphical object is sampled discretely at the sampling interval of the center distance of the pixel. Based on the data of SVOM-VT, the effect of CCD under-sampling on the encircled energy of detection camera is characterized by simulation and test. Imaging process of CCD pairs of scattered speckles from the lens is a two-dimensional discrete sampling process, as well as the sampling process of discrete signals. This process will lead to low-frequency noise (under-sampling noise) in the sampling of high-frequency signals by CCD detectors, resulting in spectrum aliasing (low-frequency signal distortion) of image signals. Intuitively, the original image is broadened. When the sampling density is increased, this will not be the case. © 2019 SPIE. |
关键词 | Encircled energy Sampling theory Undersampling CCD |
作者部门 | 检测技术研究中心 |
DOI | 10.1117/12.2539072 |
收录类别 | EI ; CPCI |
ISBN号 | 9781510634541 |
语种 | 英语 |
ISSN号 | 0277786X;1996756X |
WOS记录号 | WOS:000525828600003 |
EI入藏号 | 20200408063318 |
引用统计 | |
文献类型 | 会议论文 |
条目标识符 | http://ir.opt.ac.cn/handle/181661/93215 |
专题 | 检测技术研究中心 |
作者单位 | 1.School of Science, Xi'An Jiaotong University, Xi'an, Shaanxi; 710049, China; 2.Xi'An Institute of Optics and Precision Mechanics of CAS, Xi'an, Shaanxi; 710119, China; 3.Institute of Space Optics, Xi'An Jiaotong University, Xi'an,Shaanxi; 710049, China |
推荐引用方式 GB/T 7714 | Xue, Xun,Zhang, Chunmin,Zhao, Jianke,et al. The influence of CCD undersampling on the encircled energy of SVOM-VT[C]:SPIE,2019. |
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文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
The influence of CCD(780KB) | 会议论文 | 限制开放 | CC BY-NC-SA | 请求全文 |
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