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The influence of CCD undersampling on the encircled energy of SVOM-VT
Xue, Xun1,2,3; Zhang, Chunmin1,3; Zhao, Jianke2; Zhou, Yan2; Liu, Shangkuo2; Kewei, E.2; Li, Kun2; Wang, Zhengfeng2; Li, Jing2
2019
会议名称Applied Optics and Photonics China 2019: Space Optics, Telescopes, and Instrumentation, AOPC 2019
会议录名称AOPC 2019: Space Optics, Telescopes, and Instrumentation
卷号11341
会议日期2019-07-07
会议地点Beijing, China
出版者SPIE
产权排序1
摘要

SVOM-VT has entered the initial phase development stage, and encircled energy is its key performance index. In the development process, it is necessary to determine the encircled energy of the optical lens stage and the system stage. The image recording of a CCD detector includes two imaging processes: one is the pixel integration imaging process, in which the output signal of each pixel is proportional to the area integration of the incident light intensity on the surface of the pixel; the other is the discrete sampling process, in which the continuous graphical object is sampled discretely at the sampling interval of the center distance of the pixel. Based on the data of SVOM-VT, the effect of CCD under-sampling on the encircled energy of detection camera is characterized by simulation and test. Imaging process of CCD pairs of scattered speckles from the lens is a two-dimensional discrete sampling process, as well as the sampling process of discrete signals. This process will lead to low-frequency noise (under-sampling noise) in the sampling of high-frequency signals by CCD detectors, resulting in spectrum aliasing (low-frequency signal distortion) of image signals. Intuitively, the original image is broadened. When the sampling density is increased, this will not be the case. © 2019 SPIE.

关键词Encircled energy Sampling theory Undersampling CCD
作者部门检测技术研究中心
DOI10.1117/12.2539072
收录类别EI ; CPCI
ISBN号9781510634541
语种英语
ISSN号0277786X;1996756X
WOS记录号WOS:000525828600003
EI入藏号20200408063318
引用统计
文献类型会议论文
条目标识符http://ir.opt.ac.cn/handle/181661/93215
专题检测技术研究中心
作者单位1.School of Science, Xi'An Jiaotong University, Xi'an, Shaanxi; 710049, China;
2.Xi'An Institute of Optics and Precision Mechanics of CAS, Xi'an, Shaanxi; 710119, China;
3.Institute of Space Optics, Xi'An Jiaotong University, Xi'an,Shaanxi; 710049, China
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Xue, Xun,Zhang, Chunmin,Zhao, Jianke,et al. The influence of CCD undersampling on the encircled energy of SVOM-VT[C]:SPIE,2019.
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