| A fault injection system for space imaging application | |
Wang, Jinqiao1,2; Duan, Yongqiang1 ; Ma, Tengfei1
| |
| 2019 | |
| 会议名称 | Applied Optics and Photonics China 2019: Display Technology and Optical Storage, AOPC 2019 |
| 会议录名称 | AOPC 2019: Display Technology and Optical Storage |
| 卷号 | 11335 |
| 会议日期 | 2019-07-07 |
| 会议地点 | Beijing, China |
| 出版者 | SPIE |
| 产权排序 | 1 |
| 摘要 | The SRAM-based FPGAs are widely used in space imaging system because of their reprogramming advantages. However, designers must be concerned with the effect of single event upset(SEU) on FPGA configuration memory in the space application. To evaluate the performance of SRAM-based FPGA against SEU, simulating SEU fault injection test is a common method. This paper mainly studies the method of fault injection test and the structure of test platform. The data of CCD driving timing is flipped bit by bit on the test platform. And finally count the fault rate is 1.25%, then taking about 240ms to repair the fault. © 2019 SPIE. |
| 关键词 | space imaging fault injection scrubbing SRAM-based FPGA |
| 作者部门 | 空间光学技术研究室 |
| DOI | 10.1117/12.2544241 |
| 收录类别 | EI ; CPCI |
| ISBN号 | 9781510634428 |
| 语种 | 英语 |
| ISSN号 | 0277786X;1996756X |
| WOS记录号 | WOS:000525858100008 |
| EI入藏号 | 20200308054548 |
| 引用统计 | |
| 文献类型 | 会议论文 |
| 条目标识符 | http://ir.opt.ac.cn/handle/181661/93192 |
| 专题 | 空间光学技术研究室 |
| 作者单位 | 1.Xi'an Institute of Optics and Precision Mechanics, CAS, Xi'an; 710119, China; 2.University of Chinese Academy of Science, Beijing; 100049, China |
| 推荐引用方式 GB/T 7714 | Wang, Jinqiao,Duan, Yongqiang,Ma, Tengfei. A fault injection system for space imaging application[C]:SPIE,2019. |
| 条目包含的文件 | ||||||
| 文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | ||
| A fault injection sy（1070KB） | 会议论文 | 限制开放 | CC BY-NC-SA | 请求全文 | ||
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论