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题名:
Distinguishing the number of captured microspheres in dual-beam optical trap by measuring the back light signal
作者: Zhou, Deyuan1; Chen, Xinlin1; Xiao, Guangzong1,2; Han, Xiang1; Jin, Shilong1
出版日期: 2017
会议名称: Applied Optics and Photonics China: Optoelectronics and Micro/Nano-Optics, AOPC 2017
会议日期: 2017-06-04
会议地点: Beijing, China
DOI: 10.1117/12.2284995
通讯作者: Xiao, Guangzong (xiaoguangzong@nudt.edu.cn)
英文摘要: Optical traps have been widely used in a large variety of applications ranging from biophysics to nano-sciences. More than one microscopic object can be captured in an optical trap. In the practical application, it is always necessary to distinguish and control the number of captured objects in the optical trap. In this paper, a novel method has been presented to distinguish the number of trapped microspheres by measuring the intensity of back signal. Clear descent of the back signal has been observed when a microsphere is captured in the center of optical trap. The relative coupling efficiency of back signal decreases as the number of captured microspheres increases both in experiment and theory. This method contributes to miniaturization and integration of applied systems due to getting rid of the imaging system, and is generally applicable to the area of nanoparticle trapping. © 2017 SPIE.
收录类别: EI
会议录: AOPC 2017: Optoelectronics and Micro/Nano-Optics
会议录出版者: SPIE
语种: 英语
作者部门: 瞬态光学技术国家重点实验室
卷号: 10460
产权排序: 2
ISBN号: 9781510614017
ISSN号: 0277786X
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.opt.ac.cn/handle/181661/29873
Appears in Collections:瞬态光学技术国家重点实验室_会议论文

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作者单位: 1. College of Optoelectronic Science and Engineering, National University of Defense Technology, Changsha
2.410073, China
3. State Key Laboratory of Transient Optics and Photonic, Chinese Academy of Sciences, Xian
4.710068, China

Recommended Citation:
Zhou, Deyuan,Chen, Xinlin,Xiao, Guangzong,et al. Distinguishing the number of captured microspheres in dual-beam optical trap by measuring the back light signal[C]. 见:Applied Optics and Photonics China: Optoelectronics and Micro/Nano-Optics, AOPC 2017. Beijing, China. 2017-06-04.
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文件名: Distinguishing the number of captured microspheres in dual-beam optical trap by measuring the back light signal.pdf
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